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Thursday | 8:30 AM – 12:00 PM

August 10, 2017

This track is included as part of the FREE Limited Access Pass.

The following high quality, peer reviewed papers will be presented as live and recorded oral presentations. Each will include an interactive question and answer session at the end of their respective topics.

Zhong Chen, ETS-Lindgren, Cedar Park, TX, USA
Dave Arnett, Hewlett Packard, Vancouver, WA, USA

Speakers and Topics:

8:30 am – 9:00 am
Required Bandwidth for Time-Domain Measurement of the Quality Factor of Reverberation Chambers
Neda Nourshamsi, James C. West, and Charles F. Bunting, Oklahoma State University, Stillwater, OK, USA

9:00 am – 9:30 am
Free Space Antenna Factor Computation using Time Domain Gating and Deconvolution Filter for Site Validation of Fully Anechoic Rooms
Anoop Adhyapak, Zhong Chen, ETS-Lindgren, Cedar Park, TX, USA; Kazuo Shimada, ETS-Lindgren, Tokyo, Japan

9:30 am – 10:00 am
Development of a 3D Scanning System for Magnetic Near-Field Characterization
K. Jomaa, N. Sivaraman, and F. Ndagijimana, Université Grenoble Alpes, Grenoble, France; H. Ayad, M. Fadlallah, and J. Jomaah, Lebanese University, Beirut, Lebanon

10:30 am – 11:00 am
A Low Frequency Electric Field Probe for Near-Field Measurement in EMC Applications
Guanghua Li and David Pommerenke, Missouri University of Science and Technology, Rolla, MO, USA; Jin Min, Amber Precision Instruments, San Jose, CA, USA

11:00 am – 11:30 am
Site Contributions for Radiated Emission Measurement Uncertainties above 1 GHz
Zhong Chen and Zubiao Xiong, ETS-Lindgren, Cedar Park, TX, USA

11:30 am – 12:00 pm
The Future of Immunity Testing
Flynn Lawrence, AR RF/Microwave Instrumentation, Souderton, PA, USA

Exclusively Online

Technical Presentation

8:30 am – 9:15 am ET
Rohde & Schwarz presents: How to Significantly Reduce EMI Test Time
Bill Wangard, Product Manager, Rohde & Schwarz USA Inc.